Zilta – renamed Siniavsky Enterprises LaserTecn team whose scientific jobs have been begun from 1982 in Vilnius Science-Research Institute of Radiomeasuring Instruments. Siniavsky’s team had made several successful laser-devices of ultrafast optoelectronics and fiber optics before the Soviet Union reformation. The post graduated of the Moscow State University on laser spectroscopy Sinjavsky Nikolaj be in lead all the time. Established in 1993, as a spin-off from Vilnius Science-Research Institute of Radiomeasuring Instruments, Siniavsky’s team work in USA-Lithuania Co Aitisa till 1996 –when Siniavsky Enterprises was founded separatly. From this date we had opened additional business - to supply science and laser optics, crystals, equipment and laser systems. All time we closely cooperated with many centers of science, manufacturers of unique optics and technologies. More than 15 year we are providing the Science and Laser Optics market successfully.
Zilta strength is built on profound knowledge accumulated by its people in general and its leader Nikolaj Siniavskij in particular. Our abilities based over 35 year experience in laser physics, spectroscopy, laser and optical design, exceptionally detailed R & D of fast optoelectronics, science and laser measured systems. We welcome you to view our site to learn more about our complete solutions including. Thank you for visiting ZILTA.
Commercial offer
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Shape: Plane. Spherical-Cylindrical-Toroidal. Ellipsoidal, Parabolic, Hyperbolic & Free Form.
Micro-Roughness(rms):<2nm (conventional polishing); <0.1nm (Magnetorheological finishing).
Computer controlled fine-correction polishing; Smart Ion Beam Figuring: look here
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Substrate material: AstroSitall® & Zerodur; Fused Silica; other on request.
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COATING: High Reflection (HR) with Ion Beam Assistance from XUV to THz wavelength region (from 0.5 nm to 5 mm):
Standard EUV (Cr_binder +Au (Pt) 50nm): unprotected HR @ (15÷170) nm & (Vis-IR) at normal and grazing incidence;
Special “EUV” (Cr_binder + metal Ingredients): unprotected HR @ (4÷90) nm at grazing incidence;
Special “XUV”: HR@(1÷50) nm at grazing incidence; Special “THz”@(0.6-1000 µm) at normal and grazing incidence.
Special “Laser”: dielectric or metal protected HR (with high induced damage threshold);
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Specification
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Enhanced
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Standard
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Minimal standard
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Control method and Notes
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Dimensions [mm]
“Synchrotron mirrors”
“Astro & Space mirrors”
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Up to 500
Up to 1500
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150 – 250
300 - 500
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90 – 110
200 - 250
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Customer’s drawing preferably
Unique diamond calibers certificated at Institute of Standards.
Direct optical measurements: ±0.01% @ (0.1-30) m
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Clear aperture (CA)
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Up to 100 %
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90 %
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-
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Tolerances of RoC
(Radius of Curvature)
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0.01%
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0.4 %
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1 %
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Roughness, RMS [nm]
“Synchrotron mirrors”
“Astro & Space mirrors”
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~ 0.1
~ 0.1
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~ 1
~ 10
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-
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Micromap measurements 0.05 nm @ (1-400) um;
3D Optical Profiler " TalySurf CCI " Zygo Co *)
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Slope error (RMS)
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0.08 arcSec
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2-20 arcSec
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-
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"VeryFire (AMETEK)" Zygo Co”. with objective ø 500 mm
2D-map topography of “Height Error” of the CA mirror by
Lateral shift Interferometric Inspection scheme **)
The quality of the focal image by "Focal Spot Dia”
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Shape accuracy, RMS
(at test λ=632nm)
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λ /300 (flat, spherical)
λ /150 (OAP, elliptical)
λ /100 (free form)
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λ /50 - λ /60
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λ /40 (Flat, Spherical)
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λ /30 (Aspherical)
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OAP: Off Axis Angle
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179°
(grazing incidence)
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0° -30°
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35° -160°
not considered
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No quote of OAP made on Diamond Turning Technology
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*) The TalySurf CCI is an advanced 3-dimensional non-contact optical metrology tool used for advanced surface characterization. These instruments have the ability to offer a true topo-graphical representation of a Roughness with 0.01 nm Z-resolution over a full scan range, with over 1,000,000 data points www.taylor-hobson.com/non-contact-profilers.html